PRAI History

PRAI 2024 2024 the 7th International Conference on Pattern Recognition and Artificial Intelligence (Click) August 15-17, 2024 | Hangzhou, China Proceedings Online IEEE Xplore: https://ieeexplore.ieee.org/xpl/conhome/10826573/proceeding Indexed by Ei Compendex & Scopus after the conference (会后已被EI, SCOPUS检索)
PRAI 2023 2023 the 6th International Conference on Pattern Recognition and Artificial Intelligence (Click) August 18-20, 2023 | Haikou, China Proceedings Online IEEE Xplore: https://ieeexplore.ieee.org/xpl/conhome/10330801/proceeding Indexed by Ei Compendex & Scopus after the conference (会后3个月被EI, SCOPUS检索)
PRAI 2022 2022 the 5th International Conference on Pattern Recognition and Artificial Intelligence (Click) August 19-21, 2022 | Chengdu, China | Virtual Conference Proceedings Online IEEE Xplore: https://ieeexplore.ieee.org/xpl/conhome/9904023/proceeding Indexed by Ei Compendex & Scopus after the conference (会后被EI, SCOPUS检索)
PRAI 2021 2021 the 4th International Conference on Pattern Recognition and Artificial Intelligence (Click) August 20-22, 2021 | Yibin, China | Virtual Conference Proceedings Online IEEE Xplore: https://ieeexplore.ieee.org/xpl/conhome/9550757/proceeding Indexed by Ei Compendex & Scopus 2 months after the conference (会后2个月被EI, SCOPUS检索)
PRAI 2020 2020 the 3rd International Conference on Pattern Recognition and Artificial Intelligence (Click) August 28-30, 2020 | Chengdu, China | Virtual Conference Proceedings Online ACM Library: https://dl.acm.org/doi/proceedings/10.1145/3449301 (Conjuctionn with ICRAI 2020)
PRAI 2019 2019 the International Conference on Pattern Recognition and Artificial Intelligence Wenzhou-Kean University, Wenzhou, Zhejiang, China | August 26-28, 2019 Proceedings Online ACM Digital Library: https://dl.acm.org/doi/proceedings/10.1145/3357777
PRAI 2018 2018 the International Conference on Pattern Recognition and Artificial Intelligence Kean University, Union, NJ, USA | August 15-17th, 2018 Proceedings Online ACM Digital Library: https://dl.acm.org/doi/proceedings/10.1145/3243250